Test Materials | Exposure time (mins.) | Mean OD540 | % Viability | ET50 mins. | MIP |
---|---|---|---|---|---|
NEGATIVE CONTROL | 960 | 1.685 | 100 | ||
1440 | |||||
NANO-CeO2 | 960 | 2.010 | 119.29 | 1517.18 | <0.01 |
1200 | 1.138 | 67.54 | |||
1440 | 1.089 | 64.63 | |||
NON-NANO CeO2 | 960 | 1.994 | 92.87 | > 1440 | 0.03 |
1200 | 1.975 | 97.36 | |||
1440 | 1.729 | 85.23 | |||
POSITIVE CONTROL 1% TX100 | 240 | 1.035 | 61.42 | 260.10 | <0.18 |
360 | 0.212 | 12.58 | |||
480 | 0.095 | 5.64 | |||
REFERENCE MATERIAL 20% SLS | 15 | 0.983 | 58.34 | 20.68 | 1.00 |
30 | 0.710 | 42.14 | |||
60 | 0.273 | 16.20 | |||
120 | 0.100 | 5.93 |