Fig. 2From: Compositional and structural analysis of engineered stones and inorganic particles in silicotic nodules of exposed workersBSE-SEM micrograph (× 1000 magnification) from the center of a nodule in sample S3 (a), together with representative EDX map from regions A (e), B (f), C (g) and D (h) for Si (green) and Al (red) signals. Overlay of BSE-SEM images and EDX maps for Si (green) in sample S7 for regions A (i), B (j), C (k) and D (l)Back to article page